| 학회 |
한국고분자학회 |
| 학술대회 |
2005년 가을 (10/13 ~ 10/14, 제주 ICC) |
| 권호 |
30권 2호 |
| 발표분야 |
고분자 나노구조와 물성 |
| 제목 |
Development of Synchrotron Grazing Incidence X-ray Scattering and Its Applications to Characterize Nanoscale Structures and Properties |
| 초록 |
Grazing incidence X-ray scattering (GIXS) from structures within a thin film on a substrate is generally a superposition of the two scatterings generated by the two X-ray beams (reflected and transmitted beams) converging on the film with a difference of twice the incidence angle (i) of the X-ray beam in their angular directions; these two scatterings may overlap or may be distinct, depending on i. The two scatterings are further distorted by the effects of refraction. These reflection and refraction effects mean that GIXS is complicated to analyze. To quantitatively analyze GISAXS patterns, we newly derived a GISAXS formula under the distorted wave Born approximation. We applied this formula to the quantitative analysis of the GIXS patterns obtained for various nanoporous and nanostructured polymer films in nanoscale thicknesses. Our study also provides a simple method for understanding GIXS patterns, and for determining the structure factor or interference function from them. In addition to the static GIXS measurements and data analyses, we first demonstrated in-situ GIXS measurements and quantitative data analyses. Further the GIXS technique can provide the electron density and depth profile. Thus the use of the GIXS technique with our derived GISAXS formula as a data analysis engine is a very powerful tool for determining the nanostructures and properties in nanoscale thin films, which is essential for the 21st century’ nanotechnology. |
| 저자 |
이문호, 윤지환, 이병두, 오원태, 박영희, 황영택, 진경식, 허규영, 진상우, 김종승, 김종성, 김종승, 김제한, 김광우
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| 소속 |
포항공과대 |
| 키워드 |
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| E-Mail |
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