| 학회 |
한국고분자학회 |
| 학술대회 |
2006년 봄 (04/06 ~ 04/07, 일산킨텍스) |
| 권호 |
31권 1호 |
| 발표분야 |
기능성 고분자 나노재료 |
| 제목 |
Quantitative analysis of various functional nanostructures by synchrotron grazing incidence X-ray scattering |
| 초록 |
Recently we newly developed the grazing incidence X-ray scattering (GIXS) theory and its data analysis method. GIXS has several important advantages over transmission X-ray and neutron scattering and electron microscopy: (i) a highly intense scattering pattern is always obtained, even for films of nanoscale thickness, because the X-ray beam path length through the film plane is sufficiently long; (ii) there is no unfavorable scattering from the substrate on which the film is coated; and (iii) easy sample preparation. GIXS measurements with synchrotron radiation sources were conducted statically and in-situ for a series of nanoscale thin films prepared from nanoporous dielectrics, block copolymers, brush polymers, and molecular assemblies. All GIXS measurements were performed at the Pohang Accelerator Laboratory (PAL). The measured scattering data were analyzed in detail by using the newly developed GIXS scattering theory. |
| 저자 |
이문호1, 윤진환2, 진경식3, 허규용4, 진상우5, 김제한1, 김광우2
|
| 소속 |
1포항공과대, 2고분자(연), 3포항가속기(연), 4기능성분자집합체연구센터, 5BK 분자과학사업단 |
| 키워드 |
ㅁㅁㅁㅁ |
| E-Mail |
|
