화학공학소재연구정보센터
학회 한국재료학회
학술대회 2016년 봄 (05/18 ~ 05/20, 여수 디오션리조트 )
권호 22권 1호
발표분야 G. 나노/박막 재료 분과
제목 Relative luminance based optical method for identifying the number of graphene layers
초록 The physical and electronic characteristics of graphene film significantly vary with its number of layers, and thus the rapid and accurate estimation of the number of graphene layers is essentially required in practical applications as well as in fundamental studies. To date many efforts have been devoted to this issue and several methods based on transmission electron microscopy, atomic force microscopy, Raman spectroscopy, optical microscopy, etc., are now available. Among these, an optical method, in particular based on relative luminance, is a fast, simple and nondestructive technique. However, it still suffers from certain drawbacks that (1) only the central region (central ~30%) of optical image is able to be used for the analysis due to the variation in the light intensity and (2) the sensitivity of discerning the number of graphene layers (i.e., the change in relative luminance with increasing number of graphene layers) is relatively low, causing difficulty in exactly identifying the number of graphene layers. These drawbacks certainly restrict the effectiveness of this method. In this study, therefore, we attempted to resolve these drawbacks by combining a CCD camera with a wide field of view and functionalized optical techniques such as a differential interference contrast technique and polarization technique.  
저자 라케쉬사르비드레1, 이창준2, 김택남3, 홍성구2
소속 1배제대, 2한국표준과학(연), 3배재대
키워드 Graphene; Number of graphene layers; Optical microscopy; Relative luminance
E-Mail