검색결과 : 2건
No. | Article |
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1 |
In-Situ Ellipsometry and SHG Measurements of the Growth of CdS Layers on Cdxhg1-Xte Wark A, Berlouis LE, Jackson F, Lochran S, Cruickshank FR, Brevet PF Journal of Electroanalytical Chemistry, 435(1-2), 173, 1997 |
2 |
Galvanomagnetic Study of P-Hg1-xCdxTe Passivated Surfaces Hoschl P, Moravec P, Franc J, Grill R, Milev P, Belas E Journal of Vacuum Science & Technology B, 11(6), 2062, 1993 |