화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images using AXSIA
Ohlhausen JAT, Keenan MR, Kotula PG, Peebles DE
Applied Surface Science, 231-2, 230, 2004
2 Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images-looking beyond the obvious
Smentkowski VS, Ohlhausen JA, Kotula PG, Keenan MR
Applied Surface Science, 231-2, 245, 2004