검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Microstructural characterization of ion assisted SiO2 thin films by visible and infrared ellipsometry Brunet-Bruneau A, Souche D, Fisson S, Van VN, Vuye G, Abeles F, Rivory J Journal of Vacuum Science & Technology A, 16(4), 2281, 1998 |
| 2 |
Visible and infrared ellipsometry study of ion assisted SiO2 films Souche D, Brunet-Bruneau A, Fisson S, Van VN, Vuye G, Abeles F, Rivory J Thin Solid Films, 313-314, 676, 1998 |
| 3 |
Growth of Low and High Refractive-Index Dielectric Layers as Studied by in-Situ Ellipsometry Van VN, Fisson S, Frigerio JM, Rivory J, Vuye G, Wang Y, Abeles F Thin Solid Films, 253(1-2), 257, 1994 |