화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Evaluation of substrate (Ni)-catalyzed electroless gold plating process
Osaka T, Misato T, Sato J, Akiya H, Homma T, Kato M, Okinaka Y, Yoshioka O
Journal of the Electrochemical Society, 147(3), 1059, 2000
2 Novel global planarization technology for interlayer dielectrics using spin on glass film transfer and hot pressing
Machida K, Kyuragi H, Akiya H, Imai K, Tounai A, Nakashima A
Journal of Vacuum Science & Technology B, 16(3), 1093, 1998
3 Observation of Defects in Thermal Oxides of Polysilicon by Transmission Electron-Microscopy Using Copper Decoration
Itsumi M, Akiya H, Tomita M, Ueki T, Yamawaki M
Journal of the Electrochemical Society, 144(2), 600, 1997
4 Electrical Characteristics of a WSix Contact Electrode with a Wsixn Diffusion Barrier Formed by Using Electron-Cyclotron-Resonance Plasma Nitridation
Hirata A, Hosoya T, Machida K, Kyuragi H, Akiya H
Journal of the Electrochemical Society, 144(11), 3993, 1997
5 On-Chip Decoupling Capacitance with High Dielectric-Constant and Strength Using SrTiO3 Thin-Films Electron-Cyclotron-Resonance-Sputtered at 400-Degrees-C
Itsumi M, Ohfuji S, Tsukada M, Akiya H
Journal of the Electrochemical Society, 144(12), 4321, 1997
6 Barrier Height Lowering and Instability of Gate Oxides Due to Dilute Hydrofluoric-Acid Pretreatment
Akiya H, Itsumi M
Journal of the Electrochemical Society, 143(3), 973, 1996
7 Copper Decoration Followed by TEM Observation Defects in the Buried Oxides of SOI Substrates
Itsumi M, Omura Y, Imai K, Ueki T, Akiya H, Tomita M, Yamawaki M
Journal of the Electrochemical Society, 143(7), 2357, 1996
8 Passivation of Sodium-Ions in Metal-Oxide-Semiconductor Structures by Annealing with Ultraviolet-Light
Itsumi M, Akiya H, Nakayama S, Yoshino H
Journal of the Electrochemical Society, 143(10), 3359, 1996
9 A Wsixn Diffusion Barrier Formed with Electron-Cyclotron-Resonance Nitrogen Plasma
Hirata A, Hosoya T, Machida K, Takaoka H, Akiya H
Journal of the Electrochemical Society, 143(11), 3747, 1996
10 Generation of Si-SiO2 Interface States at Surface-Potentials Near 0.4 and 0.7 eV
Itsumi M, Shimaya M, Akiya H, Shiono N
Journal of the Electrochemical Society, 143(11), 3757, 1996