검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
SCALPEL mark detection using Si/SiO2 and 100 keV backscattered electrons Farrow RC, Mkrtchyan M, Kizilyalli IC, Waskiewicz WK, Hopkins LC, Alakan A, Gibson G, Brown P, Misra S, Trimble L Journal of Vacuum Science & Technology B, 19(5), 1852, 2001 |