검색결과 : 5건
No. | Article |
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1 |
Electrical properties of Molecular Beam Epitaxy grown Barium Titanate probed by conductive Atomic Force Microscopy Martin S, Baboux N, Albertini D, Gautier B Thin Solid Films, 642, 324, 2017 |
2 |
Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis Fares B, Gautier B, Albertini D, Mzerd A, Loghmarti M Applied Surface Science, 308, 24, 2014 |
3 |
Pulsed laser deposition of epitaxial ferroelectric Pb(Zr,Ti)O-3 films on silicon substrates Borowiak AS, Niu G, Pillard V, Agnus G, Lecoeur P, Albertini D, Baboux N, Gautier B, Vilquin B Thin Solid Films, 520(14), 4604, 2012 |
4 |
Interpretation of scanning capacitance microscopy for thin oxides characterization Ligor O, Gautier B, Descamps-Mandine A, Albertini D, Baboux N, Militaru L Thin Solid Films, 517(24), 6721, 2009 |
5 |
Structural, optical and electrical properties of beta-In2S3-3xO3x thin films obtained by PVD Barreau N, Marsillac S, Albertini D, Bernede JC Thin Solid Films, 403-404, 331, 2002 |