화학공학소재연구정보센터
검색결과 : 5건
No. Article
1 Electrical properties of Molecular Beam Epitaxy grown Barium Titanate probed by conductive Atomic Force Microscopy
Martin S, Baboux N, Albertini D, Gautier B
Thin Solid Films, 642, 324, 2017
2 Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis
Fares B, Gautier B, Albertini D, Mzerd A, Loghmarti M
Applied Surface Science, 308, 24, 2014
3 Pulsed laser deposition of epitaxial ferroelectric Pb(Zr,Ti)O-3 films on silicon substrates
Borowiak AS, Niu G, Pillard V, Agnus G, Lecoeur P, Albertini D, Baboux N, Gautier B, Vilquin B
Thin Solid Films, 520(14), 4604, 2012
4 Interpretation of scanning capacitance microscopy for thin oxides characterization
Ligor O, Gautier B, Descamps-Mandine A, Albertini D, Baboux N, Militaru L
Thin Solid Films, 517(24), 6721, 2009
5 Structural, optical and electrical properties of beta-In2S3-3xO3x thin films obtained by PVD
Barreau N, Marsillac S, Albertini D, Bernede JC
Thin Solid Films, 403-404, 331, 2002