검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Electrical characterization of Si1-xGex p-metal-oxide-semiconductor channel by admittance spectroscopy Alieu J, Souifi A, Bremond G, Bouillon P, Skotnicki T Journal of Vacuum Science & Technology B, 16(3), 1675, 1998 |
| No. | Article |
|---|---|
| 1 |
Electrical characterization of Si1-xGex p-metal-oxide-semiconductor channel by admittance spectroscopy Alieu J, Souifi A, Bremond G, Bouillon P, Skotnicki T Journal of Vacuum Science & Technology B, 16(3), 1675, 1998 |