검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Application of a novel test system to characterize single-event effects at cryogenic temperatures Ramachandran V, Gadlage MJ, Ahlbin JR, Narasimham B, Alles ML, Reed RA, Bhuva BL, Massengill LW, Black JD, Foster CN Solid-State Electronics, 54(10), 1052, 2010 |
| 2 |
Effects of fin width on memory windows in FinFET ZRAMs Zhang EX, Fleetwood DM, Alles ML, Schrimpf RD, Mamouni FE, Xiong W, Cristoloveanu S Solid-State Electronics, 54(10), 1155, 2010 |
| 3 |
Proton-induced SEU in SiGe digital logic at cryogenic temperatures Sutton AK, Moen K, Cressler JD, Carts MA, Marshall PW, Pellish JA, Ramachandran V, Reed RA, Alles ML, Nju G Solid-State Electronics, 52(10), 1652, 2008 |