검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
The microstructure and X-ray reflectivity of Mo/Si multilayers Andreev SS, Gaponov SV, Gusev SA, Haidl MN, Kluenkov EB, Prokhorov KA, Polushkin NI, Sadova EN, Salashchenko NN, Suslov LA, Zuev SY Thin Solid Films, 415(1-2), 123, 2002 |
| 2 |
High-Resolution Auger Depth Profiling of Multilayer Structures Mo/Si, Mo/B4C, Ni/C Andreev SS, Akhsakhalyan AD, Drozdov MN, Polushkin NI, Salashchenko NN Thin Solid Films, 263(2), 169, 1995 |