검색결과 : 14건
No. | Article |
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1 |
Influence of Etch Stops on the Microstructure of Porous Silicon Layers Billat S, Thonissen M, Arensfischer R, Berger MG, Kruger M, Luth H Thin Solid Films, 297(1-2), 22, 1997 |
2 |
Chemical Surface Modification of Porous Silicon Using Tetraethoxysilane Linsmeier J, Wust K, Schenk H, Hilpert U, Ossau W, Fricke J, Arensfischer R Thin Solid Films, 297(1-2), 26, 1997 |
3 |
Analysis of the Depth Homogeneity of P-PS by Reflectance Measurements Thonissen M, Berger MG, Billat S, Arensfischer R, Kruger M, Luth H, Theiss W, Hillbrich S, Grosse P, Lerondel G, Frotscher U Thin Solid Films, 297(1-2), 92, 1997 |
4 |
Dielectric Filters Made of PS - Advanced Performance by Oxidation and New Layer Structures Berger MG, Arensfischer R, Thonissen M, Kruger M, Billat S, Luth H, Hilbrich S, Theiss W, Grosse P Thin Solid Films, 297(1-2), 237, 1997 |
5 |
Color-Sensitive Photodetector Based on Porous Silicon Superlattices Kruger M, Marso M, Berger MG, Thonissen M, Billat S, Loo R, Reetz W, Luth H, Hilbrich S, Arensfischer R, Grosse P Thin Solid Films, 297(1-2), 241, 1997 |
6 |
The Application of Porous Silicon Interference Filters in Optical Sensors Hilbrich S, Arensfischer R, Kupper L, Theiss W, Berger MG, Kruger M, Thonissen M Thin Solid Films, 297(1-2), 250, 1997 |
7 |
Illumination-Assisted Formation of Porous Silicon Thonissen M, Berger MG, Arensfischer R, Gluck O, Kruger M, Luth H Thin Solid Films, 276(1-2), 21, 1996 |
8 |
Investigation of Different Oxidation Processes for Porous Silicon Studied by Spectroscopic Ellipsometry Frotscher U, Rossow U, Ebert M, Pietryga C, Richter W, Berger MG, Arensfischer R, Munder H Thin Solid Films, 276(1-2), 36, 1996 |
9 |
Electrical Contact to Porous Silicon by Electrodeposition of Iron Ronkel F, Schultze JW, Arensfischer R Thin Solid Films, 276(1-2), 40, 1996 |
10 |
Porous Silicon Multilayer Optical Wave-Guides Loni A, Canham LT, Berger MG, Arensfischer R, Munder H, Luth H, Arrand HF, Benson TM Thin Solid Films, 276(1-2), 143, 1996 |