검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
ToF-SIMS depth profiling of (Ga,Mn)As capped with amorphous arsenic: Effects of annealing time Bexell U, Stanciu V, Warnicke P, Osth M, Svedlindh P Applied Surface Science, 252(19), 7252, 2006 |
| No. | Article |
|---|---|
| 1 |
ToF-SIMS depth profiling of (Ga,Mn)As capped with amorphous arsenic: Effects of annealing time Bexell U, Stanciu V, Warnicke P, Osth M, Svedlindh P Applied Surface Science, 252(19), 7252, 2006 |