검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Ellipsometry of single-layer antireflection coatings on transparent substrates Azzam RMA Applied Surface Science, 421, 271, 2017 |
| 2 |
Surface roughness and optical contact characterization of transparent prisms using frustrated total internal reflection tunneling ellipsometry Azzam RMA Thin Solid Films, 571, 666, 2014 |
| 3 |
The intertwined history of polarimetry and ellipsometry Azzam RMA Thin Solid Films, 519(9), 2584, 2011 |
| 4 |
Spectroscopic ellipsometry using the grating division-of-amplitude photopolarimeter (G-DOAP) Krishnan S, Hampton S, Azzam RMA Thin Solid Films, 455-56, 24, 2004 |
| 5 |
Prism spectroscopic ellipsometer Azzam RMA, Sudradjat FF, Uddin MN Thin Solid Films, 455-56, 54, 2004 |
| 6 |
Spectrophotopolarimeter based on multiple reflections in a coated dielectric slab Azzam RMA, El-Saba AM, Abushagur MAG Thin Solid Films, 313-314, 53, 1998 |