화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Ab initio calculations of B diffusion in SiC
Rurali R, Hernandez E, Godignon P, Rebollo J, Ordejon P
Materials Science Forum, 389-3, 553, 2002
2 Annealing of a vacancy-type defect and diffusion of implanted boron in 6H-SiC
Ohshima T, Uedono A, Eryu O, Lee KK, Abe K, Itoh H, Nakashima K
Materials Science Forum, 433-4, 633, 2002
3 Comparison of SiGe and SiGe : C heterojunction bipolar transistors
Knoll D, Heinemann B, Ehwald KE, Tillack B, Schley P, Osten HJ
Thin Solid Films, 369(1-2), 342, 2000