검색결과 : 16건
| No. | Article |
|---|---|
| 1 |
Electrode protective barrier layers for molten carbonate confinement Jamale A, Starykevich M, Marques FMB International Journal of Energy Research, 45(2), 2945, 2021 |
| 2 |
Voltage-assisted SILAR deposition of CdSe quantum dots to construct a high performance of ZnS/CdSe/ZnS quantum dot-sensitized solar cells Jin BB, Kong SY, Zhang GQ, Chen XQ, Ni HS, Zhang F, Wang DJ, Zeng JH Journal of Colloid and Interface Science, 586, 640, 2021 |
| 3 |
On the electrochemistry of an anode stack for all-solid-state 3D-integrated batteries Baggetto L, Oudenhoven JFM, van Dongen T, Klootwijk JH, Mulder M, Niessen RAH, de Croon MHJM, Notten PHL Journal of Power Sources, 189(1), 402, 2009 |
| 4 |
Thermal stability of tungsten-titanium diffusion barriers for silver metallization Bhagat SK, Theodore ND, Alford TL Thin Solid Films, 516(21), 7451, 2008 |
| 5 |
Depth profile and interface analysis in the nm-range Oswald S, Reiche R, Zier M, Baunack S, Wetzig K Applied Surface Science, 252(1), 3, 2005 |
| 6 |
In-line phase and texture control in microelectronics industry Kozaczek K Materials Science Forum, 495-497, 1343, 2005 |
| 7 |
Electroless processes for micro- and nanoelectronics Shacham-Diamand Y, Inberg A, Sverdlov Y, Bogush V, Croitoru N, Moscovich H, Freeman A Electrochimica Acta, 48(20-22), 2987, 2003 |
| 8 |
Low temperature chemical vapor deposition of titanium nitride films from tetrakis(ethylmethylamido)titanium and ammonia Panda S, Kim J, Weiller BH, Economou DJ, Hoffman DM Thin Solid Films, 357(2), 125, 1999 |
| 9 |
Structural and electrical properties of chemical vapor deposition tungsten overgrowth on physical vapor deposited and metalorganic chemical vapor deposited TiN adhesion layers Peng YC, Chen LJ, Hsieh WY, Yang YR, Hsieh YF Journal of Vacuum Science & Technology B, 16(4), 2013, 1998 |
| 10 |
Properties of sputtered Cr-O and reactively sputtered Cr-N-O as passivation layers against copper oxidation Chuang JC, Chen MC Journal of Vacuum Science & Technology B, 16(6), 3021, 1998 |