검색결과 : 52건
| No. | Article |
|---|---|
| 1 |
Electrodeposition and electroless plating of hierarchical metal superstructures composed of 1D nano- and microscale building blocks Muench F, Felix EM, Rauber M, Schaefer S, Antoni M, Kunz U, Kleebe HJ, Trautmann C, Ensinger W Electrochimica Acta, 202, 47, 2016 |
| 2 |
Pilot plant for electron beam treatment of flue gases from heavy fuel oil fired boiler Pawelec A, Chmielewski AG, Licki J, Han B, Kim J, Kunnummal N, Fageeha OI Fuel Processing Technology, 145, 123, 2016 |
| 3 |
Characteristics of Slice InGaN/GaN Light Emitting Diodes by Focused Ion Beam Milling Hsu CK, Sheu JK, Wang JK, Lee ML, Chang KH, Tu SJ, Lai WC Electrochemical and Solid State Letters, 14(8), H343, 2011 |
| 4 |
Ag-N doped ZnO film and its p-n junction fabricated by ion beam assisted deposition Yan Z, Ma YP, Deng PR, Yu ZS, Liu C, Song ZT Applied Surface Science, 256(7), 2289, 2010 |
| 5 |
The Influence of Specific Anion Adsorption on the Surface Roughness of Electrodeposited Polycrystalline Cu Films Vasiljevic N, Wood M, Heard PJ, Schwarzacher W Journal of the Electrochemical Society, 157(4), D193, 2010 |
| 6 |
On the Relation Between Oxide Ridge Evolution and Alloy Surface Grain Boundary Disorientation in Fe-22 wt % Cr Alloys Zhu JX, Diaz LMF, Holcomb GR, Jablonski PD, Cowen CJ, Laughlin DE, Alman D, Sridhar S Journal of the Electrochemical Society, 157(5), B655, 2010 |
| 7 |
Numerical Assessment of SOFC Anode Polarization Based on Three-Dimensional Model Microstructure Reconstructed from FIB-SEM Images Shikazono N, Kanno D, Matsuzaki K, Teshima H, Sumino S, Kasagi N Journal of the Electrochemical Society, 157(5), B665, 2010 |
| 8 |
Performance Deterioration of Ni-YSZ Anode Induced by Electrochemically Generated Steam in Solid Oxide Fuel Cells Matsui T, Kishida R, Kim JY, Muroyama H, Eguchi K Journal of the Electrochemical Society, 157(5), B776, 2010 |
| 9 |
Effect of Morphology and Hydrogen Evolution on Porosity of Electroplated Cobalt Hard Gold Liu ZW, Zheng M, Hilty RD, West AC Journal of the Electrochemical Society, 157(7), D411, 2010 |
| 10 |
Analysis and metrology with a focused helium ion beam Sijbrandij S, Notte J, Scipioni L, Huynh C, Sanford C Journal of Vacuum Science & Technology B, 28(1), 73, 2010 |