검색결과 : 2건
No. | Article |
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1 |
Compact modeling of CMOS transistors under variable uniaxial stress Wacker N, Richter H, Hassan MU, Rempp H, Burghartz JN Solid-State Electronics, 57(1), 52, 2011 |
2 |
Worst-case analysis and statistical simulation of MOSFET devices based on parametric test data Zhang Q, Liou JJ, McMacken J, Thomson JR, Stiles K, Layman P Solid-State Electronics, 45(9), 1537, 2001 |