검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Capacitance-voltage study of single-crystalline Si dots on ultrathin buried SiO2 formed by nanometer-scale local oxidation Ishikawa Y, Kosugi M, Kumezawa M, Tsuchiya T, Tabe M Thin Solid Films, 369(1-2), 69, 2000 |
| 2 |
Deuterium sintering of silicon-on-insulator structures: D diffusion and replacement reactions at the SiO2/Si interface Wallace RM, Chen PJ, Archer LB, Anthony JM Journal of Vacuum Science & Technology B, 17(5), 2153, 1999 |
| 3 |
Paramagnetic Point-Defects in Amorphous Thin-Films of SiO2 and Si3N4 - Updates and Additions Poindexter EH, Warren WL Journal of the Electrochemical Society, 142(7), 2508, 1995 |