검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
Rapid passivation of carrier-induced defects in p-type multi-crystalline silicon Payne DNR, Chan CE, Hallam BJ, Hoex B, Abbott MD, Wenham SR, Bagnall DM Solar Energy Materials and Solar Cells, 158, 102, 2016 |
| 2 |
The Effects of Varied Deposition Conditions, Including the Use of Argon, on Thin-Film Silicon Solar Cells Prepared using PECVD Crudgington LJ, Rind MA, Payne DNR, Bagnall DM Molecular Crystals and Liquid Crystals, 591(1), 91, 2014 |
| 3 |
Optical characterisation of a spectrally tunable plasmonic reflector for application in thin-film silicon solar cells Sesuraj RSA, Temple TL, Bagnall DM Solar Energy Materials and Solar Cells, 111, 23, 2013 |
| 4 |
Single step deposition method for nearly stoichiometric CuInSe2 thin films Karthikeyan S, Hill AE, Pilkington RD, Cowpe JS, Hisek J, Bagnall DM Thin Solid Films, 519(10), 3107, 2011 |
| 5 |
Influence of localized surface plasmon excitation in silver nanoparticles on the performance of silicon solar cells Temple TL, Mahanama GDK, Reehal HS, Bagnall DM Solar Energy Materials and Solar Cells, 93(11), 1978, 2009 |
| 6 |
Photovoltaic technologies Bagnall DM, Boreland M Energy Policy, 36(12), 4390, 2008 |
| 7 |
A detailed study of p-n junction solar cells by means of collection efficiency Kittidachachan P, Markvart T, Bagnall DM, Greef R, Ensell GJ Solar Energy Materials and Solar Cells, 91(2-3), 160, 2007 |
| 8 |
High-resolution electron beam lithography for the fabrication of high-density dielectric metamaterials Zhang W, Potts A, Bagnall DM, Davidson BR Thin Solid Films, 515(7-8), 3714, 2007 |
| 9 |
Large area all-dielectric planar chiral metamaterials by electron beam lithography Zhang W, Potts A, Bagnall DM, Davidson BR Journal of Vacuum Science & Technology B, 24(3), 1455, 2006 |
| 10 |
Raised source/drains for 50 nm MOSFETs using a silane/dichlorosilane mixture for selective epitaxy Waite AM, Lloyd NS, Osman K, Zhang W, Ernst T, Achard H, Wang Y, Deleonibus S, Hernment PLF, Bagnall DM, Evans AGR, Ashburn P Solid-State Electronics, 49(4), 529, 2005 |