검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Thermodynamical computation and physicochemical characterization of thin films deposited by electric-discharge-assisted chemical vapor deposition Sassi Z, Chafik K, Bureau JC, Glachant A, Balland B Applied Surface Science, 193(1-4), 26, 2002 |
| 2 |
Ionic Contamination in Metal-Oxide-Semiconductor Al/SiO2/3C-SiC Capacitors Raynaud C, Autran JL, Briot JB, Balland B, Becourt N, Jaussaud C Journal of the Electrochemical Society, 142(1), 282, 1995 |
| 3 |
Low-Energy (3-100 eV) Electron-Bombardment-Induced Nitridation of Thin SiO2-Films - Physicochemical and Electrical Analyses Glachant A, Garcia V, Balland B, Bureau JC, Plossu C, Dupuy JC, Straboni A Thin Solid Films, 238(1), 31, 1994 |