검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
TEM anti ellipsometry studies of nanolaminate oxide films prepared using atomic layer deposition Mitchell DRG, Attard DJ, Finnie KS, Triani G, Barbe CJ, Depagne C, Bartlett JR Applied Surface Science, 243(1-4), 265, 2005 |
| 2 |
Sol-gel bonding of silicon wafers - Part 1: Influence of the processing temperature on final bond morphology and interfacial energy Barbe CJ, Cassidy DJ, Triani G, Latella BA, Mitchell DRG, Finnie KS, Short K, Bartlett JR, Woolfrey JL, Collins GA Thin Solid Films, 488(1-2), 153, 2005 |
| 3 |
Sol-gel bonding of silicon wafers - Part 2. Influence of the sol-gel chemistry on bond morphology and interfacial energy Barbe CJ, Cassidy DJ, Triani G, Latella BA, Mitchell DRG, Finnie KS, Bartlett JR, Woolfrey JL, Collins GA Thin Solid Films, 488(1-2), 160, 2005 |
| 4 |
Influence of Si(100) surface pretreatment on the morphology of TiO2 films grown by atomic layer deposition Finnie KS, Triani G, Short KT, Mitchell DRG, Attard DJ, Bartlett JR, Barbe CJ Thin Solid Films, 440(1-2), 109, 2003 |
| 5 |
Evaluation of interfacial toughness and bond strength of sandwiched silicon structures Latella BA, Nicholls TW, Cassidy DJ, Barbe CJ, Triani G Thin Solid Films, 411(2), 247, 2002 |