검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterization of ITO- and TiOxNy films by spectroscopic ellipsometry, spectraphotometry and XPS Bartella J, Schroeder J, Witting K Applied Surface Science, 179(1-4), 181, 2001 |
| No. | Article |
|---|---|
| 1 |
Characterization of ITO- and TiOxNy films by spectroscopic ellipsometry, spectraphotometry and XPS Bartella J, Schroeder J, Witting K Applied Surface Science, 179(1-4), 181, 2001 |