검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Reliability properties of SiGeHBTs Rennane A, Bary L, Roux JL, Kuchenbecker J, Graffeuil J, Plana R Applied Surface Science, 224(1-4), 341, 2004 |
| 2 |
Noise behavior in SiGe devices Regis M, Borgarino M, Bary L, Llopis O, Graffeuil J, Escotte L, Koenig U, Plana R Solid-State Electronics, 45(11), 1891, 2001 |