검색결과 : 1건
No. | Article |
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1 |
At-wavelength interferometry for extreme ultraviolet lithography Tejnil E, Goldberg KA, Lee SH, Medecki H, Batson PJ, Denham PE, MacDowell AA, Bokor J, Attwood D Journal of Vacuum Science & Technology B, 15(6), 2455, 1997 |