화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Interface Characterization of an InP/InGaAs Resonant-Tunneling Diode by Scanning-Tunneling-Microscopy
Wu W, Skala SL, Tucker JR, Lyding JW, Seabaugh A, Beam EA, Jovanovic D
Journal of Vacuum Science & Technology A, 13(3), 602, 1995
2 Interface Characterization in an InP/InGaAs Resonant-Tunneling Diode by Scanning-Tunneling-Microscopy
Skala SL, Wu W, Tucker JR, Lyding JW, Seabaugh A, Beam EA, Jovanovic D
Journal of Vacuum Science & Technology B, 13(2), 660, 1995