검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Ti2AlN thin films synthesized by annealing of (Ti plus Al)/AlN multilayers Cabioch T, Alkazaz M, Beaufort MF, Nicolai J, Eyidi D, Eklund P Materials Research Bulletin, 80, 58, 2016 |
| 2 |
Parametric investigation of the formation of epitaxial Ti3SiC2 on 4H-SiC from Al-Ti annealing Abi-Tannous T, Soueidan M, Ferro G, Lazar M, Toury B, Beaufort MF, Barbot JF, Penuelas J, Planson D Applied Surface Science, 347, 186, 2015 |
| 3 |
Effect of hot-filament annealing in a hydrogen atmosphere on the electrical and structural properties of Nb-doped TiO2 sputtered thin films Tavares CJ, Castro MV, Marins ES, Samantilleke AP, Ferdov S, Rebouta L, Benelmekki M, Cerqueira MF, Alpuim P, Xuriguera E, Riviere JP, Eyidi D, Beaufort MF, Mendes A Thin Solid Films, 520(7), 2514, 2012 |
| 4 |
Electrical properties of AlNxOy thin films prepared by reactive magnetron sputtering Borges J, Martin N, Barradas NP, Alves E, Eyidi D, Beaufort MF, Riviere JP, Vaz F, Marques L Thin Solid Films, 520(21), 6709, 2012 |
| 5 |
Optical and nuclear characterization of Xe-induced nanoporosity in SiO2 Naas A, De Sousa-Meneses D, Hakim B, Regula G, Beaufort MF, Belaidi A, Ntsoenzok E Thin Solid Films, 518(16), 4721, 2010 |
| 6 |
Three-layer structure of hydrogenated Czochralski silicon Ma Y, Job R, Huang YL, Fahrner WR, Beaufort MF, Barbot JF Journal of the Electrochemical Society, 151(9), G627, 2004 |
| 7 |
Contribution of X-Ray Diffraction simulations to experimental study of high energy He implantation at high dose in 4H-SiC at room temperature Declemy A, Shiryaev A, Stepanov S, Barbot JF, Beaufort MF, Oliviero E, Ntsoenzok E, Sauvage T Materials Science Forum, 457-460, 937, 2004 |
| 8 |
Synthesis of TiC/Ni cermets via mechanically activated self-propagating high-temperature synthesis. Dubois S, Heian E, Karnatak N, Beaufort MF, Vrel D Materials Science Forum, 426-4, 2033, 2003 |
| 9 |
Properties and Stability of Cu-YBaCuO Composites Elaborated by Extrusion of an Elemental Powder Mixture Dupeyrat P, Beaufort MF, Grosbras M, Gao F Journal of Materials Science, 31(18), 4927, 1996 |