검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Interface states distribution in electrical stressed oxynitrided gate-oxide Belkouch S, Nguyen TK, Landsberger LM, Aktik C, Jean C, Kahrizi M Journal of the Electrochemical Society, 145(7), 2489, 1998 |
| 2 |
Electrical characterization of thin SiO2 films on silicon created by anodic oxygen corona discharge processing Sayedi SM, Landsberger LM, Kahrizi M, Belkouch S, Landheer D Journal of the Electrochemical Society, 145(8), 2937, 1998 |
| 3 |
Back-surface passivation of polycrystalline CdSe thin-film transistors Landheer D, Masson DP, Belkouch S, Das SR, Quance T, LeBrun L, Hulse JE Journal of Vacuum Science & Technology A, 16(2), 834, 1998 |
| 4 |
Effects of initial annealing treatments on the electrical characteristics and stability of unpassivated CdSe thin film transistors Belkouch S, Landheer D, Masson DP, Das SR, Quance T, LeBrun L, Rolfe SJ Journal of Vacuum Science & Technology A, 16(2), 860, 1998 |
| 5 |
Electrical Characterization of Oxynitrided Gate Dielectrics Under Constant-Current Fowler-Nordheim Stress Nguyen TK, Landsberger LM, Belkouch S, Jean C Journal of the Electrochemical Society, 144(9), 3299, 1997 |