검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Parasitic resistance considerations of using elevated source/drain technology for deep submicron metal oxide semiconductor field effect transistors Sun J, Bartholomew RF, Bellur K, Srivastava A, Osburn CM, Masnari NA, Westhoff R Journal of the Electrochemical Society, 145(6), 2131, 1998 |
| 2 |
A Comparative-Study of N(+)/P Junction Formation for Deep-Submicron Elevated Source/Drain Metal-Oxide-Semiconductor Field-Effect Transistors Sun J, Bartholomew RF, Bellur K, Srivastava A, Osburn CM, Masnari NA, Westhoff R Journal of the Electrochemical Society, 144(10), 3659, 1997 |