검색결과 : 2건
No. | Article |
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1 |
Synchrotron x-ray diffraction and transmission electron microscopy studies of interfacial reaction paths and kinetics during annealing of fully-002-textured Al/TiN bilayers Chun JS, Carlsson JRA, Desjardins P, Bergstrom DB, Petrov I, Greene JE, Lavoie C, Cabral C, Hultman L Journal of Vacuum Science & Technology A, 19(1), 182, 2001 |
2 |
Single-Phase Polycrystalline Ti1-Xwxn Alloys (O-Less-Than-or-Equal-to-X-Less-Than-or-Equal-to-0.7) Grown by UHV Reactive Magnetron Sputtering - Microstructure and Physical-Properties Moser JH, Tian F, Haller O, Bergstrom DB, Petrov I, Greene JE, Wiemer C Thin Solid Films, 253(1-2), 445, 1994 |