| 1 |
XPS analyses of lanthanides phosphates
Glorieux B, Berjoan R, Matecki M, Kammouni A, Perarnau D
Applied Surface Science, 253(6), 3349, 2007 |
| 2 |
Solar preparation of SiOx (x approximate to 1) nanopowders from silicon vaporisation on a ZrO2 pellet. XPS and photoluminescence characterisation
Teixeira F, Berjoan R, Peraudeau G, Perarnau D
Solar Energy, 78(6), 763, 2005 |
| 3 |
Variations in the physico-chemical properties of near-stoichiometric silica deposited from SiH4-N2O and SiH4-N2O-He radiofrequency discharges
Chayani M, Caquineau H, Despax B, Bandet J, Berjoan R
Thin Solid Films, 471(1-2), 53, 2005 |
| 4 |
Controlled nucleation and growth of thin hydroxyapatite layers on titanium implants by using induction heating technique
Morales JG, Clemente RR, Armas B, Combescure C, Berjoan R, Cubo J, Martinez E, Carmona JG, Garelik S, Murtra J, Muraviev DN
Langmuir, 20(13), 5174, 2004 |
| 5 |
Influence of dopant concentration and type of substrate on the local organization of low-pressure chemical vapour deposition in situ boron doped silicon films from silane and boron trichloride
Caussat B, Scheid E, de Mauduit B, Berjoan R
Thin Solid Films, 446(2), 218, 2004 |
| 6 |
XPS and AFM characterisation of selective monolayers for cationic detection: application to field effect chemical micro-sensors
Rochefeuille S, Berjoan R, Seta P, Jimenez C, Desfours JP
Chemical Physics Letters, 376(3-4), 274, 2003 |
| 7 |
Corrosion of borosilicate sealing glasses for molten carbonate fuel cells
Pascual MJ, Pascual L, Valle FJ, Duran A, Berjoan R
Journal of the American Ceramic Society, 86(11), 1918, 2003 |
| 8 |
Thermodynamic study and characterization of low pressure chemically vapor deposited silicon oxynitride films from tetraethylorthosilicate, dichlorosilane and ammonia gas mixtures
Vamvakas VE, Davazoglou D, Berjoan R, Schamm S, Vahlas C
Thin Solid Films, 429(1-2), 77, 2003 |
| 9 |
Surface investigation of plasma HMDSO membranes post-treated by CF4/Ar plasma
Finot E, Roualdes S, Kirchner M, Rouessac V, Berjoan R, Durand J, Goudonnet JP, Cot L
Applied Surface Science, 187(3-4), 326, 2002 |
| 10 |
Mass density determination of thin organosilicon films by X-ray reflectometry
van der Lee A, Roualdes S, Berjoan R, Durand J
Applied Surface Science, 173(1-2), 115, 2001 |
