검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Spectroscopic ellipsometry characterization of amorphous carbon and amorphous, graphitic and fullerene-like carbon nitride thin films Berlind T, Furlan A, Czigany Z, Neidhardt J, Hultman L, Arwin H Thin Solid Films, 517(24), 6652, 2009 |
| 2 |
Structure of DC sputtered Si-C-N thin films Radnoczi G, Safran G, Czigany Z, Berlind T, Hultman L Thin Solid Films, 440(1-2), 41, 2003 |
| 3 |
Growth of CNx/BN : C multilayer films by magnetron sputtering Johansson MP, Hellgren N, Berlind T, Broitman E, Hultman L, Sundgren JE Thin Solid Films, 360(1-2), 17, 2000 |