1 |
Patterning and passivation effects of zinc-tin-oxide thin-film transistors using an electrohydrodynamic jet printer Kwack YJ, Choi WS Materials Research Bulletin, 114, 170, 2019 |
2 |
25th Anniversary Article: Microstructure Dependent Bias Stability of Organic Transistors Lee WH, Choi HH, Kim DH, Cho K Advanced Materials, 26(11), 1660, 2014 |
3 |
Improving the electrical performance of HfInZnO-TFI's by introducing a thin ITO interlayer Li J, Ding XW, Zhang JH, Zhu WQ, Jiang XY, Zhang ZL Current Applied Physics, 14(8), 1036, 2014 |
4 |
Control of electrical properties and gate bias stress stability in solution-processed a-IZO TFTs by Zr doping Choi WS, Jo H, Kwon MS, Jung BJ Current Applied Physics, 14(12), 1831, 2014 |
5 |
SiOx interlayer to enhance the performance of InGaZnO-TFT with AlOx gate insulator Li J, Zhou F, Lin HP, Zhu WQ, Zhang JH, Jiang XY, Zhang ZL Current Applied Physics, 12(5), 1288, 2012 |
6 |
Improvement in the bias stability of tin oxide thin-film transistors by hafnium doping Kim WS, Moon YK, Kim KT, Shin SY, Park JW Thin Solid Films, 520(6), 2220, 2012 |