검색결과 : 1건
No. | Article |
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1 |
Study of the Electrical Active Defects Induced by Reactive Ion Etching in N-Type Silicon Biavati M, Perezquintana I, Poggi A, Susi E Journal of Vacuum Science & Technology B, 13(5), 2139, 1995 |
No. | Article |
---|---|
1 |
Study of the Electrical Active Defects Induced by Reactive Ion Etching in N-Type Silicon Biavati M, Perezquintana I, Poggi A, Susi E Journal of Vacuum Science & Technology B, 13(5), 2139, 1995 |