화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 A method of fabricating metal-insulator-metal (MIM) capacitor in Cu/low-k backend interconnection process for RF application
Yu MB, Ning J, Balakumar S, Bliznetsov VN, Lo GQ, Balasubramanian N, Kwong DL
Thin Solid Films, 504(1-2), 257, 2006
2 Comparative studies of physical and chemical properties of plasma-treated CVD low k SiOCH dielectrics
Tsang CF, Su YJ, Bliznetsov VN
Thin Solid Films, 462-63, 269, 2004
3 Deep trench etch and clean process technology for CU/SiOC passive device
Yu MB, Bliznetsov VN, Chang CK, Murthy BR
Thin Solid Films, 462-63, 302, 2004