검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Sub-nanometer resolution XPS depth profiling: Sensing of atoms Szklarczyk M, Macak K, Roberts AJ, Takahashi K, Hutton S, Glaszczka R, Blomfield C Applied Surface Science, 411, 386, 2017 |
| 2 |
Quantitative XPS imaging - new possibilities with the delay-line detector Vohrer U, Blomfield C, Page S, Roberts A Applied Surface Science, 252(1), 61, 2005 |
| 3 |
Multivariate statistical analysis for x-ray photoelectron spectroscopy spectral imaging: Effect of image acquisition time Peebles DE, Ohlhausen JA, Kotula PG, Hutton S, Blomfield C Journal of Vacuum Science & Technology A, 22(4), 1579, 2004 |
| 4 |
X-ray photoelectron spectroscopy evidence for the covalent bond between an iron surface and aryl groups attached by the electrochemical reduction of diazonium salts Boukerma K, Chehimi MM, Pinson J, Blomfield C Langmuir, 19(15), 6333, 2003 |