검색결과 : 11건
| No. | Article |
|---|---|
| 1 |
Vacancy defects induced in sintered polished UO2 disks by helium implantation Labrim H, Barthe MF, Desgardin P, Sauvage T, Blondiaux G, Corbel C, Piron JP Applied Surface Science, 252(9), 3256, 2006 |
| 2 |
Thermal evolution of vacancy defects induced in sintered UO2 disks by helium implantation Labrim H, Barthe MF, Desgardin P, Sauvage T, Blondiaux G, Corbel C, Piron JP Applied Surface Science, 252(9), 3262, 2006 |
| 3 |
Electron irradiation induced vacancy defects detected by positron annihilation in 6H-SiC Barthe MF, Henry L, Arpiainen S, Blondiaux G Materials Science Forum, 483, 473, 2005 |
| 4 |
Near surface vacancy defects in sintered polished UO2 disks Barthe MF, Guilbert S, Labrim H, Desgardin P, Sauvage T, Blondiaux G, Carlot G, Garcia P, Piron JP Materials Science Forum, 445-6, 48, 2004 |
| 5 |
Characterization of 3C-SiC monocrystals using positron annihilation spectroscopy Kerbiriou X, Gredde A, Barthe MF, Desgardin P, Blondiaux G Materials Science Forum, 457-460, 825, 2004 |
| 6 |
Structural modification in electron-irradiated polyetherurethane Desgardin P, Barthe MF, Blondiaux G, Oudot B, Ravat B, Grivet M, Liszkay L Applied Surface Science, 194(1-4), 195, 2002 |
| 7 |
Slow positron beam facility in Orleans Desgardin P, Liszkay L, Barthe MF, Henry L, Briaud J, Saillard M, Lepolotec L, Corbel C, Blondiaux G, Colder A, Marie P, Levalois M Materials Science Forum, 363-3, 523, 2001 |
| 8 |
Amorphous lithium cobalt and nickel oxides thin films : preparation and characterization by RBS and PIGE Benqlilou-Moudden H, Blondiaux G, Vinatier P, Levasseur A Thin Solid Films, 333(1-2), 16, 1998 |
| 9 |
Contribution of nuclear analytical techniques in optimization of Li-Ge-O thin films Roux F, Baud G, Blondiaux G, Besse JP, Caudron E, Jacquet M Solid State Ionics, 104(3-4), 177, 1997 |
| 10 |
Thermodynamic and Experimental-Study of the Chemical-Vapor Codeposition in the Silicon-Boron-Carbon System at 1400-K Goujard S, Vandenbulcke L, Bernard C, Blondiaux G, Debrun JL Journal of the Electrochemical Society, 141(2), 452, 1994 |