화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 Structural and optical characterization of MOVPE grown InGaP/GaAs MQWs for advanced photovoltaic devices
Longo M, Parisini A, Tarricone L, Vantaggio S, Bocchi C, Germini F, Lazzarini L
Journal of Crystal Growth, 311(18), 4293, 2009
2 Antireflecting-passivating dielectric films on crystalline silicon solar cells for space applications
Barrera M, Pla J, Bocchi C, Migliori A
Solar Energy Materials and Solar Cells, 92(9), 1115, 2008
3 Influence of the GaAs substrate orientation on the composition of GaxIn1-xP (x approximate to 0.5) grown by LPE and MOCVD
Mishumyi VA, de Anda F, Gorbatchev AY, Kudriavtsev Y, Elyukhin VA, Prutskij T, Pelosi C, Bocchi C, Ber BY, Vazquez FEO
Thin Solid Films, 516(22), 8092, 2008
4 Structural and electrical investigation of high temperature annealed As-implanted Si crystals
Bocchi C, Felisari L, Catellani A, Cicero G, Germini F, Gombia E, Mosca R, Nasi L, Mukhamedzhanov EK, Chuev MA, Privitera V, Camalleri M, Cali D
Journal of Vacuum Science & Technology B, 23(4), 1504, 2005
5 Effect of the growth sequence on the properties of InGaP/GaAs/InGaP quantum wells grown by LP-MOVPE from group-V metalorganic sources
Begotti M, Longo M, Magnanini R, Parisini A, Tarricone L, Bocchi C, Germini F, Lazzarini L, Nasi L, Geddo M
Applied Surface Science, 222(1-4), 423, 2004
6 Controlled intrinsic carbon doping in MOVPE-grown GaAs layers by using TMGa and TBAs
Longo M, Magnanini R, Parisini A, Tarricone L, Carbognani A, Bocchi C, Gombia E
Journal of Crystal Growth, 248, 119, 2003
7 Triple crystal diffractometry, x-ray standing wave, and transmission electron microscopy investigation of shallow BF2 implantation in Si
Bocchi C, Germini F, Ghezzi G, Gombia E, Mosca R, Nasi L, Mukhamedzhanov EK, Privitera V, Spinella C
Journal of Vacuum Science & Technology B, 20(4), 1436, 2002
8 Effects of inhomogeneities and ordering in InGaP/GaAs system grown by MOVPE
Attolini G, Bocchi C, Germini F, Pelosi C, Parisini A, Tarricone L, Kudela R, Hasenohrl S
Materials Chemistry and Physics, 66(2-3), 246, 2000