검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Investigation of laser-fired point contacts on KOH structured laser-crystallized silicon by conductive atomic force microscopy Gref O, Weizman M, Rhein H, Gabriel O, Gernert U, Schlatmann R, Boit C, Friedrich F Applied Surface Science, 374, 243, 2016 |
| 2 |
New physical techniques for IC functional analysis of on-chip devices and interconnects Boit C Applied Surface Science, 252(1), 18, 2005 |
| 3 |
High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy Olbrich A, Ebersberger B, Boit C, Niedermann P, Hanni W, Vancea J, Hoffmann H Journal of Vacuum Science & Technology B, 17(4), 1570, 1999 |