검색결과 : 2건
No. | Article |
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1 |
Reducing damage to Si substrates during gate etching processes by synchronous plasma pulsing Petit-Etienne C, Darnon M, Vallier L, Pargon E, Cunge G, Boulard F, Joubert O, Banna S, Lill T Journal of Vacuum Science & Technology B, 28(5), 926, 2010 |
2 |
Effect of Ar and N-2 addition on CH4-H-2 based chemistry inductively coupled plasma etching of HgCdTe Boulard F, Baylet J, Cardinaud C Journal of Vacuum Science & Technology A, 27(4), 855, 2009 |