화학공학소재연구정보센터
검색결과 : 51건
No. Article
1 Multi-layer thin-film electrolytes for metal supported solid oxide fuel cells
Haydn M, Ortner K, Franco T, Uhlenbruck S, Menzler NH, Stover D, Brauer G, Venskutonis A, Sigl LS, Buchkremer HP, Vassen R
Journal of Power Sources, 256, 52, 2014
2 Hydrogen-induced microstructural changes of Pd films
Cizek J, Melikhova O, Vlcek M, Lukac F, Vlach M, Prochazka I, Anwand W, Brauer G, Mucklich A, Wagner S, Uchida H, Pundt A
International Journal of Hydrogen Energy, 38(27), 12115, 2013
3 Applications of HIPIMS metal oxides
Sittinger V, Lenck O, Vergohl M, Szyszka B, Brauer G
Thin Solid Films, 548, 18, 2013
4 Defects in zinc-implanted ZnO thin films
Schmidt M, Ellguth M, Czekalla C, von Wenckstern H, Pickenhain R, Grundmann M, Brauer G, Skorupa W, Helm M, Gu QL, Ling CC
Journal of Vacuum Science & Technology B, 27(3), 1597, 2009
5 Progress of the intense positron beam project EPOS
Krause-Rehberg R, Brauer G, Jungmann M, Krille A, Rogov A, Noack K
Applied Surface Science, 255(1), 22, 2008
6 Construction and timing system of the EPOS beam system
Jungmann M, Krause-Rehberg R, Muller A, Krille A, Brauer G
Applied Surface Science, 255(1), 42, 2008
7 Defect study in ZnO related structures - A multi-spectroscopic approach
Ling CC, Cheung CK, Gu QL, Dai XM, Xu SJ, Zhu CY, Luo JM, Zhu CY, Tam KH, Djurisic AB, Beling CD, Fung S, Lu LW, Brauer G, Anwand W, Skorupa W, Ong HC
Applied Surface Science, 255(1), 58, 2008
8 Implantation-caused open volume defects in Ge after flash lamp annealing (FLA) probed by slow positron implantation spectroscopy (SPIS)
Anwand W, Skorupa W, Schumann T, Posselt M, Schmidt B, Grotzschel R, Brauer G
Applied Surface Science, 255(1), 81, 2008
9 Digital positron lifetime spectroscopy at EPOS
Krille A, Krause-Rehberg R, Jungmann M, Becvar F, Brauer G
Applied Surface Science, 255(1), 93, 2008
10 Hydrogen-induced buckling of Pd films studied by positron annihilation
Cizek J, Prochazka I, Vlach M, Zaludova N, Danis S, Dobron P, Chmelik F, Brauer G, Anwand W, Mucklich A, Nikitin E, Gemma R, Kirchheim R, Pundt A
Applied Surface Science, 255(1), 241, 2008