검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Gate oxide properties investigated by TOF-SIMS profiles on CMOS devices Zanderigo F, Brazzelli D, Rocca S, Pregnolato A, Grossi A, Queirolo G Applied Surface Science, 203, 437, 2003 |
| 2 |
High quality thin oxynitride by RTP annealing of in situ steam generation oxides for flash memory applications Brazzelli D, Ghidini G, Crivelli B, Zonca R, Bersani M Solid-State Electronics, 45(8), 1271, 2001 |