검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Optical characterization of wide bandgap semiconductors Edwards NV, Bremser MD, Batchelor AD, Buyanova IA, Madsen LD, Yoo SD, Welhkamp T, Wilmers K, Cobet C, Esser N, Davis RF, Aspnes DE, Monemar B Thin Solid Films, 364(1-2), 98, 2000 |
| 2 |
Spectroscopic ellipsometry and low-temperature reflectance : complementary analysis of GaN thin films Edwards NV, Yoo SD, Bremser MD, Horton MN, Perkins NR, Weeks TW, Liu H, Stall RA, Kuech TF, Davis RF, Aspnes DE Thin Solid Films, 313-314, 187, 1998 |