화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 Torque-mixing magnetic resonance spectroscopy
Losby JE, Sani FF, Grandmont DT, Diao Z, Belov M, Burgess JAJ, Compton SR, Hiebert WK, Vick D, Mohammad K, Salimi E, Bridges GE, Thomson DJ, Freeman MR
Science, 350(6262), 798, 2015
2 The Changing Dielectric Properties of CHO Cells Can Be Used to Determine Early Apoptotic Events in a Bioprocess
Braasch K, Nikolic-Jaric M, Cabel T, Salimi E, Bridges GE, Thomson DJ, Butler M
Biotechnology and Bioengineering, 110(11), 2902, 2013
3 Dynamic electrostatic force-gradient microscopy employing mechanoelectric cross modulation
Weng Z, Kaminski T, Bridges GE, Thomson DJ
Journal of Vacuum Science & Technology A, 24(3), 673, 2006
4 Direct evidence of "spring softening" nonlinearity in micromachined mechanical resonator using optical beam deflection technique
Zhao JH, Bridges GE, Thomson DJ
Journal of Vacuum Science & Technology A, 24(3), 732, 2006
5 Resolution enhancement in probing of high-speed integrated circuits using dynamic electrostatic force-gradient microscopy
Weng Z, Kaminski I, Bridges GE, Thomson DJ
Journal of Vacuum Science & Technology A, 22(3), 948, 2004
6 Quantitative voltage measurement of high-frequency internal integrated circuit signals by scanning probe microscopy
Weng Z, Falkingham CJ, Bridges GE, Thomson DJ
Journal of Vacuum Science & Technology A, 20(3), 999, 2002
7 Capacitance sensor with sub-zeptofarad ((10-21) F) sensitivity for scanning capacitance microscopy
Tran T, Oliver DR, Thomson DJ, Bridges GE
Journal of Vacuum Science & Technology B, 20(1), 479, 2002
8 Localized electrochemical deposition of copper microstructures
El-Giar EM, Said RA, Bridges GE, Thomson DJ
Journal of the Electrochemical Society, 147(2), 586, 2000
9 High resolution sampling electrostatic force microscopy using pulse width modulation technique
Said RA, Cheung SP, Bridges GE
Journal of Vacuum Science & Technology B, 18(2), 626, 2000
10 Non-contact probing of high speed microelectronics using electrostatic force sampling
Bridges GE, Noruttun D, Said RA, Thomson DJ, Lam T, Qi R
Journal of Vacuum Science & Technology A, 16(2), 830, 1998