검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Determination of Electronic Structure of Oxide-Oxide Interfaces by Photoemission Spectroscopy Wang HQ, Altman E, Broadbridge C, Zhu YM, Henrich V Advanced Materials, 22(26-27), 2950, 2010 |
| 2 |
Improving 4H-SiC/SiO2 interface properties by depositing ultra-thin Si nitride layer prior to formation of SiO2 and annealing Wang XW, Bu HM, Laube BL, Caragianis-Broadbridge C, Ma TP Materials Science Forum, 389-3, 993, 2002 |