검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Ultra-thin gate oxide reliability projections Weir BE, Alam MA, Silverman PJ, Baumann F, Monroe D, Bude JD, Timp GL, Hamad A, Ma Y, Brown MM, Hwang D, Sorsch TW, Ghetti A, Wilk GD Solid-State Electronics, 46(3), 321, 2002 |
| No. | Article |
|---|---|
| 1 |
Ultra-thin gate oxide reliability projections Weir BE, Alam MA, Silverman PJ, Baumann F, Monroe D, Bude JD, Timp GL, Hamad A, Ma Y, Brown MM, Hwang D, Sorsch TW, Ghetti A, Wilk GD Solid-State Electronics, 46(3), 321, 2002 |