화학공학소재연구정보센터
검색결과 : 21건
No. Article
1 Low temperature homoepitaxy of GaN structures by Vapor Liquid Solid transport
Jaud A, Auvray L, Kahouli A, Abi-Tannous T, Linas S, Ferro G, Brylinski C
Journal of Crystal Growth, 467, 18, 2017
2 Understanding the growth of p-doped 4H-SiC layers using vapour-liquid-solid transport
Vo-Ha A, Carole D, Lazar M, Tournier D, Cauwet F, Souliere V, Thierry-Jebali N, Brosselard P, Planson D, Brylinski C, Ferro G
Thin Solid Films, 548, 125, 2013
3 Conductance deep-level transient spectroscopy study of 1 mu m gate length 4H-SiC MESFETs
Gassoumi M, Bluet JM, Dermoul I, Maaref H, Guillot G, Morvan E, Dua C, Brylinski C
Solid-State Electronics, 50(2), 214, 2006
4 Hole-like Defects in n-Channel 4H-SIC MESFETs Observed by Current Transient Spectroscopy
Bluet JM, Gassoumi M, Dermoul I, Chekir F, Maaref H, Guillot G, Morvan E, Dua C, Brylinski C
Materials Science Forum, 483, 865, 2005
5 Room temperature implantation and activation kinetics of nitrogen and phosphorus in 4H-SiC crystals.
Blanque S, Perez R, Godignon P, Mestres N, Morvan E, Kerlain A, Dua C, Brylinski C, Zielinski M, Camassel J
Materials Science Forum, 457-460, 893, 2004
6 Effect of passivation on device stability and gate reverse characteristics on 4H-SiC MESFETs
Kerlain A, Morvan E, Dua C, Caillas N, Brylinski C
Materials Science Forum, 457-460, 1177, 2004
7 Deep level investigation by current and capacitance transient spectroscopy in 4H-SiC MESFETs on semi-insulating substrates.
Gassoumi M, Sghaier N, Dermoul I, Chekir F, Maaref H, Bluet JM, Guillot G, Morvan E, Noblanc O, Dua C, Brylinski C
Materials Science Forum, 457-460, 1185, 2004
8 Influence of semi-insulating substrate purity on the output characteristics of 4H-SiC MESFETs
Sghaier N, Bluet JM, Souifi A, Guillot G, Morvan E, Brylinski C
Materials Science Forum, 389-3, 1363, 2002
9 Hot-carrier luminescence in 4H-SiC MESFETs
Banc C, Bano E, Ouisse T, Noblanc O, Brylinski C
Materials Science Forum, 389-3, 1371, 2002
10 Influence of material properties on wide-bandgap microwave power device characteristics
Morvan E, Kerlain A, Dua C, Brylinski C
Materials Science Forum, 433-4, 731, 2002