검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Quantitative depth profiling of an alternating Pt/Co multilayer and a Pt-Co alloy multilayer by SIMS using a Buckminsterfullerene (C-60) source Kim KJ, Simons D, Gillen G Applied Surface Science, 253(14), 6000, 2007 |
| 2 |
Performance of a C-60(+) ion source on a dynamic SIMS instrument Fahey AJ, Gillen G, Chi P, Mahoney CM Applied Surface Science, 252(19), 7312, 2006 |