검색결과 : 14건
| No. | Article |
|---|---|
| 1 |
Lifetime behavior of laser diodes with highly strained InGaAs QWs and emission wavelength between 1120 nm and 1180 nm Bugge F, Bege R, Blume G, Feise D, Sumpf B, Werner N, Zeimer U, Paschke K, Weyers M Journal of Crystal Growth, 491, 31, 2018 |
| 2 |
MOVPE growth of laser structures for high-power applications at different ambient temperatures Bugge F, Crump P, Frevert C, Knigge S, Wenzel H, Erbert G, Weyers M Journal of Crystal Growth, 452, 258, 2016 |
| 3 |
Growth of laser diode structures with emission wavelength beyond 1100 nm for yellow-green emission by frequency conversion Bugge F, Paschke K, Blume G, Feise D, Zeimer U, Weyers M Journal of Crystal Growth, 414, 205, 2015 |
| 4 |
Combined Mg/Zn p-type doping for AlGaInP laser diodes Pohl J, Bugge F, Blume G, Knigge A, Knigge S, Erbert G, Weyers M Journal of Crystal Growth, 414, 215, 2015 |
| 5 |
MOVPE growth of Al0.85Ga0.15As for high power laser diodes emitting at 808 nm Bugge F, Netzel C, Weyers M Journal of Crystal Growth, 370, 221, 2013 |
| 6 |
In-situ etching of patterned GaAs/InGaP surfaces for highly efficient 975 nm DFB-BA diode lasers Maassdorf A, Schultz CM, Brox O, Wenzel H, Crump P, Bugge F, Mogilatenko A, Erbert G, Weyers M, Trankle G Journal of Crystal Growth, 370, 226, 2013 |
| 7 |
Characterization and optimization of 2-step MOVPE growth for single-mode DFB or DBR laser diodes Bugge F, Mogilatenko A, Zeimer U, Brox O, Neumann W, Erbert G, Weyers M Journal of Crystal Growth, 315(1), 74, 2011 |
| 8 |
MOVPE growth of InGaAs/GaAsP-MQWs for high-power laser diodes studied by reflectance anisotropy spectroscopy Bugge F, Zorn M, Zeimer U, Pietrzak A, Erbert G, Weyers M Journal of Crystal Growth, 311(4), 1065, 2009 |
| 9 |
MOVPE growth optimization for laser diodes with highly strained InGaAs MQWs Bugge F, Zeimer U, Staske R, Sumpf B, Erbert G, Weyers M Journal of Crystal Growth, 298, 652, 2007 |
| 10 |
Comprehensive characterization of MOVPE-grown AlGaAs/AlAs distributed Bragg reflector structures by optical reflectance, X-ray diffraction and atomic force microscopy Bhattacharya A, Nasarek M, Zeimer U, Klein A, Zorn M, Bugge F, Gramlich S, Weyers M Journal of Crystal Growth, 274(3-4), 331, 2005 |